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Chris Buu

Graduate Research Assistant

Department of Electrical and Computer Engineering

Chris joined the Nanoscale Materials and Device Group (previously known as the Knowlton  Research Group) in the Fall of 2006 as a sophomore, undergraduate student studying Electrical and Computer Engineering (ECE). As an undergraduate, Chris worked in the Device and IC Characterization Lab and performed various electrical characterization techniques on different metal oxide field effect transistors and devices. He helped work on various projects involving the Variable Temperature Probe Station with low temperature characterization of High-k MOS devices. He also helped implement Low Noise Spectroscopy. Chris graduated in the Spring of 2009 with a B.S. in Electrical Engineering from Boise State University.

He is currently pursuing his M.S. in Electrical Engineering at Boise State University and is continuing to work with the Nanoscale Materials and Device Group. He is working with the DNA Nanostructures project. His current project is controlled placement of micro- and nano-sized particles and electrical characterization of novel, nanoscale devices.

Instruments and Techniques

  • Keithley 4200-SCS Semiconductor Characterization System
    • Perform I-V measurements on various devices
      • IGVG , IDVG, IDVD
      • CVS, V-Ramp, Charge Pumping, DC-IV
    • Connect to external equipment to perform other measurements:
      • Capacitance-Voltage
      • Conductance
  • Agilent 4156C Precision Semiconductor Parameter Analyzer
    • Perform I-V measurements on various devices
      • IGVG , IDVG, IDVD
    • Connect to external equipment to perform other measurements:
      • Capacitance-Voltage
      • Conductance
    • Build logic devices
      • Inverter
      • NAND
      • NOR
  • Agilent 4284 Precision LCR
    • Perform Capacitance-Voltage measurements
  • Variable Temperature Probe Station
    • Helped in performing various experiments with low temperature characterization of MOS devices.
  • Stanford Research Systems Model 830 DSP Lock-In Amplifier
  • Atomic Force Microscopy
    • Bruker Dimension FastScan and Icon
    • Veeco Dimension 3100
  • Experience in the Idaho Microfabrication Laboratory
    • Scanning Electron Microscopy
    • Photolithography
  • Software used: Origin, Keithley Interactive Test Environment, Interactive Characterization Software (Agilent), MATLAB, LabVIEW, Microsoft Office Suite.

Publications

Journal Publications

  • Southwick* III, Richard G., Justin C. Reed**, Christopher Buu*, Ross Butler**, Gennadi Bersuker, and William B. Knowlton, Limitations of Poole-Frenkel Conduction in Bilayer HfO2/SiO2 MOS Devices, IEEE Transactions on Device and Materials Reliability, 10(2) (2010) pp. 201-207.

Conference and Poster Presentations

  • Lejmarc Snowball**, Donald Kellis**, Craig Onodera*, Heiu Bui, Jason Brotherton, Nick Schmidt**, Chris Buu**, Stephanie Barnes*, Elton Graugnard, William L. Hughes, Bernard Yurke, Wan Kuang, Jeunghoon Lee, and William B. Knowlton, Synthesis of End Thiolated DNA Origami Nanotubes Decorated with Gold Nanoparticles, poster presentation at the 2012 3rd Annual Pacific Northwest Louis Stokes Alliance for Minority Participation (LSAMP) Conference (Oregon State University; Feb. 10-11, 2012).
  • Blake Rapp**, Christopher Buu*, Lejmarc Snowball**, Jason Brotherton,Nick Schmidt**, Amber Lay**, William B. Knowlton, Wan Kuang, William L. Hughes, Bernard Yurke, Elton Graugnard, Progress Toward the Synthesis and Electrical Characterization of Au-Functionalized DNA Origami Nanotubes, poster presentation at the IEEE International Integrated Reliability Workshop (Fallen Leaf Lake, CA; Oct. 16-20, 2011).
  • Ryan J. Thompson**, Richard G. Southwick III, Blake A. Rapp**, Christopher Buu*, Amit Jain, and William B. Knowlton, New Applications of the Boise State Band Diagram Program, poster presentation at the IEEE International Integrated Reliability Workshop (Fallen Leaf Lake, CA; Oct. 16-20, 2011).
  • Lejmarc Snowball**, Donald L. Kellis**, Craig Onodera*, Heiu Bui*, Jason Brotherton, Nick Schmidt**, Chris Buu**, Stephanie Barnes**, Elton Graugnard, William L. Hughes, Bernard Yurke, Wan Kuang, Jeunghoon Lee, and William B. Knowlton, Synthesis of End thiolated DNA Origami Nanotubes Decorated with Gold Nanoparticles, poster presentation at the Louis Stokes Alliances for Minority Participation (LSAMP) Program poster session (Boise, Idaho, July 28, 2011).
  • S. Barnes**, C. Buu*, J. Brotherton**, H. Bui*, A. Johnson*, M. Yates*, E. Graugnard, W. Kuang, J. Lee, W. L. Hughes, W. B. Knowlton, B. Yurke, Radial Dielectrophoretic Trap for Trapping Microparticles, accepted for oral and poster presentation at the 2010 Conference on Foundations of Nanoscience (FNANO) – Self-Assembled Architectures and Devices (Snowbird, Utah; April 27-30, 2010).
  • Stephanie Barnes**, Christopher Buu*, Jason Brotherton*, Hieu Bui*, Austin Johnson**, Mallory Yates**, Wan Kuang, Jeunghoon Lee, William L. Hughes, William Knowlton, Bernard Yurke, Radial Dielectrophoretic Trap For Future Manipulation Of Individual DNA Origami Nanostrutures, oral and paper presentation at the Nanoelectronic Devices for Defense & Security Conference, (9/28-10/3/2009, Ft. Lauderdale, FL).
  • Stephanie Barnes*, Christopher Buu*, Jason Brotherton*, Hieu Bui*, Austin Johnson*, Mallory Yates*, Wan Kuang, Jeunghoon Lee, William Knowlton, Bernard Yurke, and William L. Hughes, A Radial Dielectrophoretic Trap for Individual Nanostructures, poster presentation at the 8th Annual INBRE Research Conference (Pocatello, ID; August 3-5, 2009). [2nd Place Faculty Choice Undergraduate Poster Award]
  • Justin Reed, Richard G. Southwick, Ross Butler, Christopher Buu, Experimental Evidence for Polaron Hopping Conduction in HfO2 – A Cryogenic Study, poster presentation at the 6th Annual Undergraduate Research & Scholarship Conference (Boise, ID; April 20, 2009).
  • Christopher Buu*, Justin C. Reed*, Richard G. Southwick*, Bernard Yurke, William Knowlton, Initial Investigations of Sub-RF AC Methods for Metal-Oxide- Semiconductor Devices and Trap-Based Flash Nonvolatile Memory, poster presentation at the 6th Annual Undergraduate Research & Scholarship Conference (Boise, ID; April 20, 2009).
  • Richard Southwick III*, J. Reed*, C. Buu*, H. Bui*, R. Butler*, G. Bersuker, and W.B. Knowlton, Temperature (5.6-300K) Dependence Comparison of Carrier Transport Mechanisms in HfO2/SiO2 and SiO2 MOS Gate Stacks, paper presentation at the 2008 IEEE International Integrated Reliability Workshop, (October 12-16, 2008), p.48-54. Invited to submit an extended version of this paper to IEEE Transactions on Materials and Device Reliability.
  • Christopher Buu*, Ross Bulter*, William Knowlton, The Implementation of Low Noise Spectroscopy at Boise State University, poster presentation at the 5th Annual Undergraduate Research & Scholarship Conference (Boise, ID; April 14, 2008).