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Shane Pugmire

Undergraduate Research Assistant

Department of Electrical and Computer Engineering

Shane Pugmire joined the Nanoscale Materials & Device Group in the winter of 2010 after his first semester in Electrical Engineering. His first academic interest is in literature and writing, but after having served eight years in the United States Coast Guard as an Electrician’s Mate, he hopes to apply the logical thought processes he learned in the service to make the jump from technician to engineer.

Shane is currently working on a BS in Electrical Engineering, with a minor in Physics. Additionally, he is working on a BA in English, with an emphasis in Literature. He will graduate with both degrees in 2013. He is a member of Eta Kappa Nu (Electric and Computer Engineering Honor Society).

Instruments and Techniques

  • Keithley 4200-SCS Semiconductor Characterization System
    • Perform I-V measurements on various devices
    • Connect to external equipment to perform other measurements:
      • Capacitance-Voltage
      • Conductance
  • Agilent 4156C Precision Semiconductor Parameter Analyzer
    • Perform I-V measurements on various devices
    • Connect to external equipment to perform other measurements:
      • Capacitance-Voltage
      • Conductance
  • Agilent 4284 Precision LCR
    • Perform Capacitance-Voltage measurements

Publications

Peer Reviewed Journal Publications

None at this time.

Conference Publications

Richard G. Southwick III, Shem T. Purnell**, Blake A. Rapp**, Ryan J. Thompson**, Shane K Pugmire**, Ben Kaczer, Tibor Grasser, and William B. Knowlton, Cryogenic to Room Temperature Effects of NBTI in high-k PMOS Devices, conference publication at the IEEE International Integrated Reliability Workshop (Fallen Leaf Lake, CA; Oct. 16-20, 2011).

Conference Presentations and Posters

Shem T. Purnell**, Shane K Pugmire**, Blake A. Rapp**, Ryan J. Thompson**, Richard G. Southwick III, Tibor Grasser, Ben Kaczer, and William B. Knowlton, Comparison of Trends in Cryogenic Measurements of SiO2 and HfO2/SiO2 pMOSFETs, poster presentation at the IEEE International Integrated Reliability Workshop (Fallen Leaf Lake, CA; Oct. 16-20, 2011).

B. Rapp, S. Purnell, S. Pugmire, R. Thompson, R. Butler, R. G. Southwick III, W. B. Knowlton. Thermal Effects of Light Exposure on pMOSFET Device Behavior. Poster presentation at 8th annual Undergraduate Research & Scholarship Conference (Boise, ID; April 11, 2011).