Scanning Probe and Scanning Electron Microscopy Systems
- Digital Instruments Dimension 3100 SPM with a Nanoscope V controller
- Heater-Cooler Accessory for the Dimension 3100
- Harmonix Torsional Harmonic Imaging
- Hybrid X-Y-Z Closed Loop Scanner
- Hysitron TS 75 Triboscope – Nanomechanical/Nanoindentation System
- Digital Instruments MultiMode SPM with a Nanoscope IV controller and PicoForce system
- Phenom Tabletop SEM
Capabilities
- Nanoindentation and Scratching
- Conductive AFM (CAFM)
- Tunneling AFM (TUNA)
- Scanning Spreading Resistance Microscopy (SSRM)
- Scanning Capacitance Microscopy (SCM)
- Electrostatic Force Microscopy (EFM)
- Surface Potential (SP) Imaging
- Fluid Imaging
- Force Volume
- Magnetic Force Microscopy (MFM)
- Imaging, Nanomanipulation, and Nanolithography System (NanoMan)
- Lateral Force Microscopy (LFM)
- Scanning Tunneling Microscopy (STM)
- Torsional Resonance Mode
AFM Resources
AFM Probes:
Vibration Isolation:
AFM Manufacturers:
Surface Science Lab Manager:
- Chad Watson (MSE)
Students:
Training Documents
Collaborations
- Prof. A.J. Moll (Materials Science & Engineering-Boise State)
- Prof. Peter Mullner (Materials Science & Engineering-Boise State)
- Prof. Bernie Yurke ( Materials Science & Engineering & Electrical and
Computer Engineering)-Boise State - Prof. Wan Kuang (Electrical & Computer Engineering-Boise State)
- Prof. Darryl Butt (Materials Science & Engineering-Boise State)
- Prof. Megan Frary (Materials Science & Engineering-Boise State)
- Prof. Julie Oxford (Biology-Boise State)
- Prof. Kris Campbell (Electrical & Computer Engineering-Boise State)
- Prof. Janet Callahan (Materials Science & Engineering-Boise State)
Funding
- NIH INBRE
- 2003 NIH BRIN
- DARPA project
- 2002 NSF MRI Grant